IMTS 2014 Conference: Laser Scanners Redefine Excellence

Chicago – Make plans to attend the IMTS 2014 Conferences to learn about Laser Scanners Redefining Non-Contact Measurement Excellence.

DATE: Wednesday, September 10 from 3:15 PM - 4:10 PM   ROOM: W-193B

SPEAKER: Alexander Lucas, Business Development Manager, Nikon Metrology, Inc.

CMM Laser scanner technology has advanced even further, making them invaluable in modern manufacturing. These all-new laser scanners, like the LC80Ex, combine the tradition of laser scanning excellence with the world-class clarity of premium optics to offer a blistering, fast scanning probe that redefines non-contact measurement excellence. Not only are they substantially quicker, it also raises the bar when scanning surfaces that could never before be measured via non-contact inspection. Offering amazing throughput benefits, coupled with easy-to-use programming and inspection software, the LC80Ex will be a staple of CMM-based inspections for years to come. How these advances are achieved with a full discussion of the enormous benefits derived will be presented.

The educational and informative conferences run Sept. 8-11, 2014 in the West Building, Level 1. To register for this or any session, visit www.imts.com/education/imtsconference.html.

Source: IMTS