Hollywood, Florida – Officials from the Coordinate Metrology Society (CMS) announced online registration is open for the 31st annual Coordinate Metrology Systems Conference (CMSC). The event will be held from July 20 – 24, 2015, at the Diplomat Resort and Spa in Hollywood, Florida. The CMSC is a weeklong technology conference for users of portable 3D measurement solutions applied by manufacturers and science laboratories. This seminal gathering attracts leading OEMs and service providers, as well as expert speakers delivering fresh perspectives on trends, best practices, R&D, successful applications, and innovations in the field of metrology.
Online attendee registration is now open at https://www.cmsc.org/register. Conference details for interested exhibitors can be found at https://www.cmsc.org/cmsc-exhibitor-information. CMSC attendees are metrologists, quality control professionals, manufacturing executives, and managers, scientists, students, educators, and those who want to sharpen their skill sets and broaden their knowledge of 3D portable measurement applications in aerospace, automotive, power generation, heavy industry, marine, and more.
Fulfilling its educational mandate, the CMSC will host their popular Measurement Zone with an eLearning Center, metrology challenges, educational workshops, industry updates, and networking events, in addition to their technical paper sessions. The CMSC Exhibition Hall will feature the latest in metrology products and services including industrial photogrammetry, laser trackers, laser radars, articulating arms, laser scanners, laser projection systems, indoor GPS, theodolites, inspection software, and accessories.
Call for papers continues through March 13, 2015
The CMSC Call for Papers continues until March 13, 2015. Abstract submissions are peer-reviewed by the Coordinate Metrology Society and considered for presentation at CMSC 2015. Notification of acceptance will occur on April 3, 2015. For guidelines or more information about presenting a technical paper, contact Scott Sandwith, technical presentations coordinator at presentations@cmsc.org. Guidelines for presentations and technical papers can be downloaded at 2015 CMSC Guidelines. Conference speakers gain recognition as industry experts, and all accepted white papers are peer reviewed and considered for publication in the Journal of the CMSC.
CMS Certification examinations during conference
The CMS will also offer the CMS Level-One and Level-Two certification examinations during the conference. The Level-One certification examination is a proctored, online assessment covering foundational theory and practice common to most portable 3D metrology devices. The Level-Two certification is a hands-on performance examination for users of articulated arm portable coordinate measuring machines (PCMMs). This device-specific assessment is conducted by CMS-authorized proctors. The cost for a CMS member to take either certification exam is $400, non-member pricing is also available. Certification program guidelines and application forms are available on the CMS website athttp://www.cmsc.org/cms-certification.
Source: CMS
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