Coordinate Metrology Society conference hits record attendance

Weatherford, Texas – A record number of visitors attended the Coordinate Metrology Systems Conference in Charleston, S.C. this summer.

Celebrating its 30th anniversary, the premier event for portable 3D measurement professionals attracted metrologists from around the world. Hosted by the Coordinate Metrology Society (CMS), the organization prides itself on the open, educational atmosphere found at the CMSC. The weeklong event draws the top brass in the industry, as well as novices in the field, including manufacturers, engineers, scientists, quality control specialists, metrologists, educators, and students.

Attendees are encouraged to discuss problems, find solutions, and explore the newest technology advancements from service providers and OEM manufacturers of close-tolerance, industrial coordinate measurement systems, software, and peripherals.

Twenty-four metrology professionals covered subject matter such as the application of photogrammetry for antenna measurement, the absolute positioning of robots, automated production measurement of an auto welding line, and comparing optical vision systems.

The diverse presentation roster included international speakers from The Boeing Company, Lockheed Martin , Electroimpact Inc., Gancell Pty. Ltd (Australia), NMS s.r.o. (Switzerland), Escola Politecnica da Universidade De Sao Paulo (Brazil), Espace2001 s.a., National Institute of Standards and Technology (NIST), University of California Davis, National Research Council of Canada, Premium AerotTech (Germany), Shanghai University (China), Rolls Royce, National Physical Laboratory (NPL - UK), Sigma Space, FFT Produktionssystemme GmbH (Germany), NASA Goddard Space Flight Center, Hitachi Power Solutions Co. (Japan), and other leaders in the field.

At the event, the CMS launched their Level-Two Certification, a hands-on performance examination for users of portable coordinate measuring machines (CMMs). This is the industry’s first device-specific assessment conducted by CMS-authorized proctors.

Candidates are required to complete an application process and qualify in order to take either examination. Applicants for the CMS Level-One Certification must meet eligibility requirements, sign the CMS code of ethics, and pass a peer review. Applicants for the CMS Level-Two Performance Certification must have a Level-One Certification, two years basic experience (minimum 400 hours) on an articulating arm, and submit an application with two references who can attest to their hands-on expertise. The Level-Two Certification program was professionally designed and developed in cooperation with the CMS. For more information, visit http://www.CMSC.org/cms-certification.

The CMSC featured 43 exhibitors in the action-packed Exhibition Hall where attendees viewed technology, services, and solutions for their portable metrology requirements. The well-rounded conference also included networking events, user group meetings, a popular 5 Billion Micron Fun Run/Walk, and the annual CMSC Banquet. Many attendees caught the Friday tour of the Boeing – North Charleston facility.

Source: Coordinate Metrology Society