Z-axis measuring electronic microscope

Z-axis measuring electronic microscope

March 22, 2019

Titan Tool Supply Inc.


Buffalo, New York – Titan Tool Supply Inc.’s model ZDM-3 vertical displacement microscope measures minute height variations. The Z-axis electronic depth-measuring microscope features a built-in LED co-axial illuminator to allow the user to focus on the top or bottom of the part being inspected. The illuminator includes a green filter and is adjustable to control light, color, and intensity.

Applications in electronics include measuring heights of the bonded portion of lead wire, wafer bump, lead frames, and solder on semiconductors. The new microscope also measures step heights of hybrid integrated circuits and terminal steps on multi-layer PC boards. Other applications include measuring the depth of minute cracks and engraving depth.

The ZDM-3 is available with magnifications from 50X to 400X with a standard 10X eyepiece and 100X to 800X magnifications with an optional 20X eyepiece. The ZDM-3 can be fitted with a video adapter (Model TSTVA-12 available separately) to increase magnification range and to provide greater accuracy and ease of repeatability (from 0.0002" to 0.0003"). Using the video adapter also relieves eye strain and allows for multi-viewing.

Lenses are coated to eliminate glare, and the reticle in the basic microscope and video adapter version features crosshairs with concentric circles and minute divisions of the horizontal axis and vertical axis. Optional cameras and monitors are also available with the video adapters.