Compact CMM

Compact CMM

July 18, 2019

LK Metrology

In Booth 1257 at WESTEC 2019, LK Metrology will display the Altera C 10.7.5 CMM equipped with a Renishaw PH10M probe. The 10.7.5 model is the first of three compact CMM sizes that will soon be available. The Altera C is supplied with LK Metrology’s CAMIO 8.5 programming, analysis and reporting software, plus a Renishaw articulating head and touch trigger probe which can be simply replaced with a variety of sensors, including Nikon laser scanners. The machine lowers the price of entry to LK CMM multi-sensor inspection technology.

The second CMM on display will be an Altera M SCANtek5 10.10.8 CMM equipped with Renishaw’s REVO-2 scanning probe and MODUS software.  The Altera SCANtek5 is a five axis CMM designed for high-speed continuous probe scanning, and applications requiring non-contact vision capability or surface finish analysis. The Altera range of CMMs is LK’s most configurable CMM platform available for quality and process control measurement.

The CAMIO software has become the software of choice for many of the world’s largest manufacturers because it allows the user to focus on accelerating lead times and improving product quality. Regardless of whether inspecting stamped, molded or machined parts, CAMIO 8.5 drives accurate and efficient inspection programs for geometric features along with full surface analysis with Part-to-CAD comparisons. CAMIO’s interoperability across CMM platforms, sensor technology and manufacturing sites becomes its unique advantage.

WESTEC will be held Sept. 24-26, 2019 at the Long Beach Convention center in Long Beach, California.